• Login
    • Login
    Advanced Search
    View Item 
    •   UoN Digital Repository Home
    • Theses and Dissertations
    • Faculty of Science & Technology (FST)
    • View Item
    •   UoN Digital Repository Home
    • Theses and Dissertations
    • Faculty of Science & Technology (FST)
    • View Item
    JavaScript is disabled for your browser. Some features of this site may not work without it.

    Modeling the Bivariate time to Mortality from HIV-l

    Thumbnail
    Date
    2006
    Author
    Omollo, Raymond V O
    Type
    Thesis
    Language
    en
    Metadata
    Show full item record

    Abstract
    Frailty models are used in survival analysis to account for unobserved heterogeneity in individual risks to disease and death. Heterogeneity induces deviations in an individual's risk of an event as well as associations between survival times. A bivariate frailty model characterizes the heterogeneity. The aim of this project is to model the bivariate time to mortality and determine factors associated with it. The data used is on related survival times of 476 mother-baby pairs in a two-year follow up study with several covariates such as infection status of babies, breast feeding, CD4 count and viral load. During the study follow-up 124 deaths (95 infants and 29 mothers) occurred. Key words: bivariate frailty, heterogeneity and mortality.
    URI
    http://erepository.uonbi.ac.ke:8080/xmlui/handle/123456789/26682
    Citation
    Master of Science in Biometry
    Publisher
    University of Nairobi
     
    School of Mathematics
     
    Collections
    • Faculty of Science & Technology (FST) [4213]

    Copyright © 2022 
    University of Nairobi Library
    Contact Us | Send Feedback

     

     

    Useful Links
    UON HomeLibrary HomeKLISC

    Browse

    All of UoN Digital RepositoryCommunities & CollectionsBy Issue DateAuthorsTitlesSubjectsThis CollectionBy Issue DateAuthorsTitlesSubjects

    My Account

    LoginRegister

    Copyright © 2022 
    University of Nairobi Library
    Contact Us | Send Feedback