• Login
    • Login
    Advanced Search
    View Item 
    •   UoN Digital Repository Home
    • Journal Articles
    • Faculty of Agriculture & Veterinary Medicine (FAg / FVM)
    • View Item
    •   UoN Digital Repository Home
    • Journal Articles
    • Faculty of Agriculture & Veterinary Medicine (FAg / FVM)
    • View Item
    JavaScript is disabled for your browser. Some features of this site may not work without it.

    Genetic Nature of Resistance in Corn to Yellow Leaf Blight

    Thumbnail
    Date
    1974
    Author
    Grogan, C O
    Boothroyd, C W
    Mukunya, D M
    Type
    Article
    Language
    en
    Metadata
    Show full item record

    Abstract
    Different corn (Zea mays L.) inbreds and hybrids with normal cytoplasm (N) and similar inbreds with Texas (Terns) and other male sterile cytoplasms were compared for their reaction to Phyllosticta yellow leaf blight. Considerable resistance was found in some of the corn inbreds and hybrids tested. The resistance was found to be influenced by both cytoplasmic and nuclear factors. Plants with Tcms cytoplasm were the most susceptible, while C, J, and R types of cytoplasm seemed highly resistant. The reaction of offspring derived from a cross between susceptible and resistant normal inbreds indicated existence of at least one dominant gene pair for resistance to yellow leaf blight.
    URI
    http://erepository.uonbi.ac.ke:8080/xmlui/handle/123456789/34253
    Citation
    Vol. 15 No. 4, p. 495-499
    Publisher
    Department of Plant Science and Crop Protection
    Collections
    • Faculty of Agriculture & Veterinary Medicine (FAg / FVM) [5481]

    Copyright © 2022 
    University of Nairobi Library
    Contact Us | Send Feedback

     

     

    Useful Links
    UON HomeLibrary HomeKLISC

    Browse

    All of UoN Digital RepositoryCommunities & CollectionsBy Issue DateAuthorsTitlesSubjectsThis CollectionBy Issue DateAuthorsTitlesSubjects

    My Account

    LoginRegister

    Copyright © 2022 
    University of Nairobi Library
    Contact Us | Send Feedback