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dc.contributor.authorNgugi, Eliud Kahiu
dc.date.accessioned2013-07-01T14:32:29Z
dc.date.available2013-07-01T14:32:29Z
dc.date.issued2003
dc.identifier.citationKAHIU, DRNGUGIELIUD. 2003. Locating Quantitative Trait Loci for maize stem borer resistance in Kenya through molecular markers. African Journal of Crop Science. Journal of Crop Science and Biotechnology. : Korean Society of Crop Science and Springeren
dc.identifier.urihttp://erepository.uonbi.ac.ke:8080/xmlui/handle/123456789/43596
dc.description.abstractNo abstract availableen
dc.language.isoenen
dc.publisherUniversity of Nairobien
dc.titleLocating Quantitative Trait Loci for maize stem borer resistance in Kenya through molecular markers. African Journal of Crop Scienceen
dc.typeArticleen


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