Selection of Marketable bean lines with Improved Resistance to Angular leaf spot, Root rots and Yield for smallholder farmers in ECA.
| dc.contributor.author | Kimani , Paul M | |
| dc.date.accessioned | 2013-08-01T07:41:55Z | |
| dc.date.available | 2013-08-01T07:41:55Z | |
| dc.date.issued | 2005 | |
| dc.identifier.citation | M, Fkimani Paul. 2005. Selection Of Marketable Bean Lines With Improved Resistance To Angular Leaf Spot, Root Rots And Yield For Smallholder Farmers In Eca.. Presented At Rockefeller Foundation Workshop, 23-27 January 2005, Nairobi, Kenya. | en |
| dc.identifier.uri | http://hdl.handle.net/11295/53224 | |
| dc.language.iso | en | en |
| dc.publisher | University of Nairobi | en |
| dc.title | Selection of Marketable bean lines with Improved Resistance to Angular leaf spot, Root rots and Yield for smallholder farmers in ECA. | en |
| dc.type | Presentation | en |
| local.publisher | Plant Science and Crop Protection | en |
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