Assessment of quality of trace element measurements by EDXRF technique: a statistical approach

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Date
2004
Author
Hashim, NO
Rathore, IVS
Kinyua, AM
Stangl, RL
Mustapha, AO
Type
Article
Language
en
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URI
http://www.sciencedirect.com/science/article/pii/S0969806X04002890
http://hdl.handle.net/11295/66078
Citation
Radiation Physics and Chemistry Volume 71, Issues 3–4, October–November 2004, Pages 791–792
Publisher
University of Nairobi
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