Low Frequency Dielectric Loss Measurements On Al2o3 Films
Abstract
Measurements of the dielectric loss in thin Al2O3 films at low and very low frequencies are reported. A very simple but efficient experimental technique for measuring the loss tangent was used in the study. A Debye-type relaxation peak was observed and this is discussed.
URI
http://www.sciencedirect.com/science/article/pii/004060908290503Xhttp://hdl.handle.net/11295/66167
Citation
Thin Solid Films Volume 94, Issue 2, 13 August 1982, Pages 115–117Publisher
University of Nairobi