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    Dielectric loss measurements on raw materials

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    Date
    1980
    Author
    Mwanje, J.
    Type
    en
    Language
    en
    Metadata
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    Abstract
    This paper describes a relatively simple experiment which can be performed by undergraduate students to study the dielectric properties of materials. Values of the dielectric loss tangent can be determined at low frequencies from Lissajous figures formed on an oscilloscope. Sample results for mineral rock specimens are presented. Some of these specimens show Debye‐type relaxation peaks at frequencies in the region of 1 to 500 Hz. Such losses can be reasonably represented by an equivalent circuit.
    URI
    http://scitation.aip.org/content/aapt/journal/ajp/48/10/10.1119/1.12234
    http://hdl.handle.net/11295/72671
    Citation
    Am. J. Phys. 48, 837 (1980)
    Publisher
    University of Nairobi,
    Description
    ARTICLE
    Collections
    • Faculty of Science & Technology (FST) [4284]

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