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    Investigation of the Effect of film Thickness on the Optical Properties of Amorphous Se 85-xTe15Sbx

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    Date
    2014
    Author
    Mwabora, Julius M.
    Mulama Austine A.
    Oduor Andrew O.
    Cosmas M. Muiva
    Muthoka Boniface
    Type
    Article; es
    Language
    en
    Metadata
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    Abstract
    Amorphous thin films of Se85-xTe15Sbx (x = 0.0, 0.5, 2.5, and 5.0 at. %) deposited by flash evaporation technique, have been investigated in the wavelength range of 500nm-3000nm. It is found that the effect of increasing antimony content and film thickness on the as-deposited films led to increase in the absorption coefficient. The optical band gap energy decreased with increase in antimony concentration but increased with increase in film thickness.
    URI
    http://hdl.handle.net/11295/78207
    http://journals.uonbi.ac.ke/index.php/ajps/article/view/1224
    Citation
    Mwabora, Julius M. "Investigation of the Effect of film Thickness on the Optical Properties of Amorphous Se 85-xTe15Sbx." , African Journal of Physical Sciences . 2014;1(1):38-42 .
    Publisher
    University of Nairobi
    Collections
    • Faculty of Science & Technology (FST) [4284]

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