Sequential Circuit Testability Parameter Prediction using Artificial Neural Networks

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Date
1996
Author
Waiganjo, Peter Wagacha
Type
Article
Language
en
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URI
http://hdl.handle.net/11295/27038
Citation
MSc. Thesis. Sequential Circuit Testability Parameter Prediction using Artificial Neural Networks. Shanghai University, 1996, W, DR. WAGACHA PETER , Proceedings of the Third Conference on Information Technology and Economic Development. 2004 Ghana .INTERCED, (1996) copy at http://profiles.uonbi.ac.ke/waiganjo/publications/msc-thesis-sequential-circuit-testability-parameter-prediction-using-artificial
Publisher
University of Nairobi
 
School of computing and informatics
 
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