Sequential Circuit Testability Parameter Prediction using Artificial Neural Networks
| dc.contributor.author | Waiganjo, Peter Wagacha | |
| dc.date.accessioned | 2013-05-29T12:33:26Z | |
| dc.date.available | 2013-05-29T12:33:26Z | |
| dc.date.issued | 1996 | |
| dc.identifier.citation | MSc. Thesis. Sequential Circuit Testability Parameter Prediction using Artificial Neural Networks. Shanghai University, 1996, W, DR. WAGACHA PETER , Proceedings of the Third Conference on Information Technology and Economic Development. 2004 Ghana .INTERCED, (1996) copy at http://profiles.uonbi.ac.ke/waiganjo/publications/msc-thesis-sequential-circuit-testability-parameter-prediction-using-artificial | en |
| dc.identifier.uri | http://hdl.handle.net/11295/27038 | |
| dc.language.iso | en | en |
| dc.publisher | University of Nairobi | en |
| dc.title | Sequential Circuit Testability Parameter Prediction using Artificial Neural Networks | en |
| dc.type | Article | en |
| local.publisher | School of computing and informatics | en |
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